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Muneharu Kato

Kyoto University

6

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Characterization of silicon dioxide films on 4H-SiC (0001) Si, (1-100) M, and (11-20) A faces by cathodoluminescence spectroscopy

2013 Applied Physics Letters
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Abnormal behavior of longitudinal optical phonon in silicon dioxide films on 4H-SiC bulk epitaxial substrate using Fourier transform infrared (FT-IR) spectroscopy.

2013 Applied Spectroscopy
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Characterization of silicon dioxide films on 4H-SiC Si (0001) face by cathodoluminescence spectroscopy and x-ray photoelectron spectroscopy

2012 Applied Physics Letters
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Characterization of Silicon Dioxide Films on a 4H-SiC Si(0001) Face by Fourier Transform Infrared (FT-IR) Spectroscopy and Cathodoluminescence Spectroscopy

2011 Applied Spectroscopy
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