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Stephan Mechold
Stephan Mechold
Technische Universität Ilmenau
Field electron emission
Cantilever
Optoelectronics
Scanning probe lithography
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2
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Field emission scanning probe lithography with GaN nanowires on active cantilevers
2020
Journal of Vacuum Science & Technology. B. Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
Mahmoud Behzadirad
Ashwin K. Rishinaramangalam
Daniel F. Feezell
Tito Busani
Christoph Reuter
Alexander Reum
Mathias Holz
Teodor Gotszalk
Stephan Mechold
Martin Hofmann
Ahmad Ahmad
Tzvetan Ivanov
Ivo W. Rangelow
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Active Cantilevers with Diamond-Tip for Field Emission Scanning Probe Lithography and Imaging
2019
ICM | International Conference on Mechatronics
Martin Hofmann
Stephan Mechold
Mathias Holz
Ahmad Ahmad
Tzvetan Dr. rer. nat. Ivanonv
Ivo W. Rangelow
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