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L. Roland
L. Roland
STMicroelectronics
Resistor
Engineering
Doping
Electronic engineering
Polysilicon depletion effect
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Reliability improvement of high value doped polysilicon-based resistors
2002
Microelectronics Reliability
E. Carvou
F. Le Bihan
Anne-Claire Salaün
Régis Rogel
Olivier Bonnaud
Yannick Rey-Tauriac
Xavier Gagnard
L. Roland
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