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P. S. Gromova
P. S. Gromova
National Research Nuclear University MEPhI
Safe operating area
Schottky diode
Power semiconductor device
Diode
Voltage
3
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Providing the Low Temperature of the Heat-Generating Power Devices during the Long- Term Experiment
2021
ICM | International Conference on Microelectronics
M. V. Muzafarov
A. S. Kolosova
Alexander A. Pechenkin
G. G. Davydov
P. S. Gromova
Dmitry V. Boychenko
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Heavy-Ion-Induced Single Event Burnout in SiC Schottky Diodes: Safe Operating Area
2019
P. S. Gromova
G. G. Davydov
A. S. Tararaksin
A. S. Kolosova
Dmitry V. Boychenko
V. N. Vyuginov
V.V. Luchinin
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Heavy-Ion-Induced Single Event Burnout in SiC Schottky Diodes: Safe Operating Area
2019
ICM | International Conference on Microelectronics
P. S. Gromova
G. G. Davydov
A. S. Tararaksin
A. S. Kolosova
Dmitry V. Boychenko
V. N. Vyuginov
V.V. Luchinin
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