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L. Kim
L. Kim
Chartered Semiconductor Manufacturing
AND gate
Analytical chemistry
MOSFET
Transistor
Silicon nitride
4
Papers
3
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0
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A robust 45 nm gate-length CMOSFET for 90 nm Hi-speed technology
2006
ESSDERC | European Solid-State Device Research Conference
K.Y. Lim
Victor Chan
Rajesh Rengarajan
H.K. Lee
Nivo Rovedo
Elaine Hsuen Lim
See-Hun Yang
F. Jamin
P. Nguyen
Wenhe Lin
C.W. Lai
Y. W. Teh
J. Lee
L. Kim
Z. Luo
H. Ng
J. Sudijono
C. Wann
I. Yang
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Citations (1)
A robust 45 nm gate-length CMOSFET for 90 nm Hi-speed technology
2006
Solid-state Electronics
Khee Yong Lim
Victor Chan
Rajesh Rengarajan
H.K. Lee
Nivo Rovedo
E.H. Lim
See-Hun Yang
F. Jamin
P. Nguyen
Wenhe Lin
C.W. Lai
Y. W. Teh
J. Lee
L. Kim
Z. Luo
H. Ng
J. Sudijono
Clement Hsingjen Wann
I. Yang
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Citations (1)
A robust 45 nm gate-length CMOSFET for 90 nm Hi-speed technology
2006
ESSDERC | European Solid-State Device Research Conference
K.Y. Lim
Victor Chan
Rajesh Rengarajan
H.K. Lee
Nivo Rovedo
E.H. Lim
See-Hun Yang
F. Jamin
P. Nguyen
Wenhe Lin
C.W. Lai
Y. W. Teh
J. Lee
L. Kim
Z Luo
H. Ng
J. Sudijono
Clement Hsingjen Wann
I. Yang
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Citations (1)
Interaction of middle-of-line (MOL) temperature and mechanical stress on 90nm hi-speed device performance and reliability
2005
ESSDERC | European Solid-State Device Research Conference
K.Y. Lim
Victor Chan
Rajesh Rengarajan
H.K. Lee
Nivo Rovedo
E.H. Lim
See-Hun Yang
F. Jamin
P. Nguyen
Wenhe Lin
C.W. Lai
Y. W. Teh
J. Lee
L. Kim
Z Luo
H. Ng
J. Sudijono
Clement Hsingjen Wann
I. Yang
Show All
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Citations (0)
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