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Roberto Casiraghi
Roberto Casiraghi
STMicroelectronics
Electronic engineering
Chip
CMOS
Integrated circuit
Failure rate
3
Papers
14
Citations
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A test structure for contact and via failure analysis in deep-submicrometer CMOS technologies
2006
IEEE Transactions on Semiconductor Manufacturing
Alessandro Cabrini
Daniele Cantarelli
Paolo Cappelletti
Roberto Casiraghi
Alfonso Maurelli
Marco Pasotti
Pier Luigi Rolandi
Guido Torelli
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Citations (13)
A test structure for contact and via failure analysis in deep-submicrometer CMOS technologies
2006
ICMTS | International Conference on Microelectronic Test Structures
Alessandro Cabrini
Daniele Cantarelli
Paolo Cappelletti
Roberto Casiraghi
Alfonso Maurelli
Marco Pasotti
Pier Luigi Rolandi
Guido Torelli
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