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G. Wagner
G. Wagner
Leibniz Association
Thin film
Ion beam
Ellipsometry
Wide-bandgap semiconductor
Boron nitride
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In situ ellipsometry growth characterization of dual ion beam deposited boron nitride thin films
2000
Journal of Applied Physics
E. Franke
Mathias Schubert
John A. Woollam
J.-D. Hecht
G. Wagner
H. Neumann
F. Bigl
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Citations (17)
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