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Po-Chih Su
Po-Chih Su
Analytical chemistry
NMOS logic
Power semiconductor device
Voltage
High voltage
2
Papers
20
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Investigation of self-heating induced hot-carrier-injection stress behavior in high-voltage power devices
2013
IRPS | International Reliability Physics Symposium
Y. H. Huang
L. Y. Leu
C.C. Liu
Y. H. Lee
J.-S. Wang
A Mehta
K. Wu
Hui-Ting Lu
Po-Chih Su
Jui-Ping Chiang
H. L. Chou
Yu-Chang Jong
H.-C Tuan
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Citations (8)
Two-Dimensional Carrier Profiling by Kelvin-Probe Force Microscopy
2008
Japanese Journal of Applied Physics
Bing-Yue Tsui
Chih-Ming Hsieh
Po-Chih Su
Shien-Der Tzeng
Shangjr Gwo
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Citations (12)
1