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T. J. Eijkemans

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ROLE OFSURFACEMORPHOLOGY FORINASQUANTUM DOT OR DASHFORMATIONON INGAASPJINP (100)

2007
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Ion-channeling analysis of boron clusters in silicon (vol 90, pg 4741, 2001)

2002 Journal of Applied Physics
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Low damage deposition of silicon nitride on InP substrates

1996
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