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Pat McGinnis
Pat McGinnis
IBM
Silicon on insulator
Microprocessor
Materials science
Failure analysis
Reliability engineering
3
Papers
4
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Electrical Probing Role in 14nm SOI Microprocessor Failure Analysis
2020
Zhigang Song
Pat McGinnis
Dave Albert
Greg Hornicek
Mike Tenney
Larry Fischer
John Sylvestri
Phong T. Tran
Chuck Le
Danielle Floyd
G. Lian
Steve Boettcher
M. Ali
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Vdd Leakage Analysis by a Combination of Various Failure Analysis Techniques
2008
Zhigang Song
S. B. Ippolito
Pat McGinnis
A. Shore
B. Paulucci
T Kane
Michael P. Tenney
F. G. Trudeau
A. W. Kozaczka
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Characterization and Isolation Techniques in Silicon on Insulator Technology Microprocessor Designs
2000
T Kane
Malcolm P. Cambra
Michael P. Tenney
Pat McGinnis
Anthony G. Domenicucci
Y. Wang
D. Falcon
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Citations (1)
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