author-photo

C. Lehrer

7

Papers

126

Citations

Citation Trend

Filter By

Papers (3) Sort By

Journal Conference Others

Simulation of ion beam direct structuring for 3D nanoimprint template fabrication

2006 Microelectronic Engineering
Show All
- Source
- Cite
- Save
Citations (40)
High-resolution constant-height imaging with apertured silicon cantilever probes

2001 Journal of Microscopy
Show All
- Source
- Cite
- Save
Citations (17)
Ion beam-treated silicon probes operated in transmission and cross-polarized reflection mode near-infrared scanning near-field optical microscopy (NIR-SNOM)

1999 Surface and Interface Analysis
Show All
- Source
- Cite
- Save
Citations (9)