author-photo

D.S. Gardner

Hitachi

3

Papers

24

Citations

Citation Trend

Filter By

Papers (2) Sort By

Journal Conference Others

Encapsulated copper interconnection devices using sidewall barriers

1991 VLSI-MIC | International IEEE VLSI Multilevel Interconnection Conference
Show All
- Source
- Cite
- Save
Citations (10)
High reliability interconnections for ULSI using Al-Si-Pd-Nb/Mo layered films

1990 International Electron Devices Meeting
Show All
- Source
- Cite
- Save
Citations (0)