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R.C.M. de Kruif

Philips

8

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127

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Problems in the deconvolution of SIMS depth profiles using delta-doped test structures

1993 Applied Surface Science
- P.C. Zalm
- R.C.M. de Kruif
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A high-resolution study of two-dimensional oxidation-enhanced diffusion in silicon

1993 IEDM | International Electron Devices Meeting
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Heterojunction bipolar transistors with Si 1-x Ge x base

1992 ESSDERC | European Solid-State Device Research Conference
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Heterojunction bipolar transistors with Si1−xGex base

1992 ESSDERC | European Solid-State Device Research Conference
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