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Manfred Richard Schuster
Manfred Richard Schuster
Siemens
Optics
Materials science
Monochromator
Beam (structure)
Reflectivity
2
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40
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Laterally graded multilayer optics for x-ray analysis
1999
Manfred Richard Schuster
Herbert Goebel
Lutz Bruegemann
Detlef Bahr
F. Burgaezy
Carsten Michaelsen
Michael Stoermer
P. Ricardo
Reiner Dietsch
Thomas Holz
H. Mai
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