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Bruce G. Armstrong
Bruce G. Armstrong
Raytheon
Electronic engineering
Voltage
Upset
Physics
Capacitive sensing
2
Papers
24
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0
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2024
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Standardized ferroelectric capacitor test methodology for nonvolatile semiconductor memory applications
1993
Integrated Ferroelectrics
Steve Bernacki
Larry Jack
Yanina Kisler
Steve Collins
S.D. Bernstein
Rob Hallock
Bruce G. Armstrong
Jerry Shaw
J A Evans
Bruce A. Tuttle
Bill Hammetter
Steve Rogers
Bob Nasby
Jack Henderson
Joe Benedetto
Randy Moore
Cpt Robert Pugh
Al Fennelly
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Citations (24)
A capacitively coupled dose-rate-dependent transient upset mechanism in a bipolar memory
1992
IEEE Transactions on Nuclear Science
Robert M. Turfler
Ronald L. Pease
Greg Dinger
Bruce G. Armstrong
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