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N. Gollagunta
N. Gollagunta
Pennsylvania State University
Scanning electron microscope
Transistor
Gate oxide
Trench
Analytical chemistry
2
Papers
6
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0
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The dependence of UMOSFET characteristics and reliability on geometry and processing
2001
Semiconductor Science and Technology
Samia A. Suliman
N. Gollagunta
Levent Trabzon
Jifa Hao
R.S. Ridley
C.M. Knoedler
G.M. Dolny
Osama O. Awadelkarim
Stephen J. Fonash
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Citations (6)
Characterization of gate oxide degradation mechanisms in trench-gated power MOSFETs using the charge-pumping technique
2001
ISPSD | International Symposium on Power Semiconductor Devices and IC's
Gary M. Dolny
N. Gollagunta
Samia A. Suliman
Levent Trabzon
M Horn
Osama O. Awadelkarim
Stephen J. Fonash
C.M. Knoedler
Jifa Hao
Rodney Ridley
Christopher Boguslaw Kocon
T. Grebs
Jun Zeng
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