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Kab Jin Nam
Kab Jin Nam
Gate dielectric
Dram
Propagation delay
Data retention
Leakage (electronics)
3
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Improvement of Performance and Data Retention Characteristics of Sub-50nm DRAM by HfSiON Gate Dielectric
2007
Symposium on VLSI Technology
Sang-Jin Hyun
Hye-Min Kim
Hye Lan Lee
Kab Jin Nam
Sug Hun Hong
Dong-Chan Kim
Ji Hyun Kim
Soo-ik Jang
In-sang Jeon
Sang-Bom Kang
Si-Young Choi
U-In Chung
Joo-Tae Moon
Byung Il Ryu
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Improvement of Performance and Data Retention Characteristics of Sub-50nm DRAM by HfSiON Gate Dielectric
2007
Symposium on VLSI Technology
Sang-Jin Hyun
Hye-Min Kim
Hye Lan Lee
Kab Jin Nam
Sug Hun Hong
Dong-Chan Kim
Ji Hyun Kim
Soo-ik Jang
In-sang Jeon
Sang-Bom Kang
Si-Young Choi
U-In Chung
Joo-Tae Moon
Byung Il Ryu
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Save
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