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Aida Todri

University of Montpellier

43

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321

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Protecting combinational logic in pipelined microprocessor cores against transient and permanent faults

2014 DDECS | Design and Diagnostics of Electronic Circuits and Systems
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An SRAM Based Monitor for Mixed-Field Radiation Environments

2014 IEEE Transactions on Nuclear Science
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Evaluating a radiation monitor for mixed-field environments based on SRAM technology

2014 Journal of Instrumentation
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iBoX — Jitter based Power Supply Noise sensor

2014 ETS | European Test Symposium
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Analyzing resistive-open defects in SRAM core-cell under the effect of process variability

2013 ETS | European Test Symposium
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On the reuse of read and write assist circuits to improve test efficiency in low-power SRAMs

2013 ITC | International Test Conference
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SRAM soft error rate evaluation under atmospheric neutron radiation and PVT variations

2013 IOLTS | International On-Line Testing Symposium
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Analyzing the effect of concurrent variability in the core cells and sense amplifiers on SRAM read access failures

2013 DTIS | International Conference on Design and Technology of Integrated Systems in Nanoscale Era
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Uncorrelated Power Supply Noise and Ground Bounce Consideration for Test Pattern Generation

2013 IEEE Transactions on Very Large Scale Integration Systems
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Adaptive Source Bias for Improved Resistive-Open Defect Coverage during SRAM Testing

2013 ATS | Asian Test Symposium
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