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Jack M. Higman

Motorola

4

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Variation in natural threshold voltage of NVM circuits due to dopant fluctuations and its impact on reliability

2002 IEDM | International Electron Devices Meeting
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An EEPROM model for low power circuit design and simulation

1994 IEDM | International Electron Devices Meeting
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A novel band-to-band tunneling induced convergence mechanism for low current, high density flash EEPROM applications

1994 IEDM | International Electron Devices Meeting
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