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Luo Maojiu
Luo Maojiu
Short circuit
Electrical engineering
failure mechanism
Materials science
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Investigating the Failure Mechanism of Short-Circuit Tests in 1.2-kV SiC JBS-Integrated MOSFETs
2020
IEEE Transactions on Electron Devices
Yourun Zhang
Xiao Yang
Chen Hang
Kunlin Li
Zhong Wei
Luo Maojiu
Luo Jiamin
Bo Zhang
Song Bai
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