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N. Beiranvand
N. Beiranvand
Amorphous solid
Sputter deposition
Surface roughness
Scanning electron microscope
Thin film
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Investigation of the Statistical surface morphology and optical properties of the Ag/Al and Ag/Cu thin double-layers
2013
A. Zendehnam
B. Farokhi
N. Beiranvand
S Miri
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