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Leeward Yi
Leeward Yi
Electronic engineering
Engineering
Reaction–diffusion system
High voltage
MOSFET
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A unification of interface-state generation and hole-injection for hot-carrier-injection stress in low and high-voltage NMOSFET
2008
Microelectronics Reliability
Mingzhi Dai
S. I. Kim
Andrew Yap
Shaohua Liu
Arthur Cheng
Leeward Yi
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