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A. J. Lee
A. J. Lee
Kenyon College
Ellipsometry
Optics
Thin film
Molecular beam
Analytical chemistry
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Dielectric functions and carrier concentrations of Hg1−xCdxSe films determined by spectroscopic ellipsometry
2015
Applied Physics Letters
A. J. Lee
F. C. Peiris
G. Brill
K. Doyle
T. H. Myers
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Citations (4)
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