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H. Liu

GlobalFoundries

3

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20

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Study of TDDB reliability in misaligned via chain structures

2012 IRPS | International Reliability Physics Symposium
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Highly Optimized Nanocrystal-Based Split Gate Flash for High Performance and Low Power Microcontroller Applications

2011 IMW | International Memory Workshop
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Study of upstream electromigration bimodality and its improvement in Cu low-k interconnects

2010 IRPS | International Reliability Physics Symposium
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