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Jurgen Von Bardeleben
Jurgen Von Bardeleben
Centre national de la recherche scientifique
Electron paramagnetic resonance
Materials science
Condensed matter physics
Crystallographic defect
Photochemistry
7
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24
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Analytical Electron Microscopy of Antimony Doped 4H-SiC/SiO 2 and 4H-SiC/Boron and Phosphorus Doped SiO 2 Interface Structures in MOS Devices
2018
Bulletin of the American Physical Society
Taufik Adi Nugraha
Martin Rohrmüller
Uwe Gerstmann
Siegmund Greulich-Weber
J.L. Cantin
Jurgen Von Bardeleben
Wolfgang Schmidt
Stefan Martin Wippermann
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La spectroscopie de résonance ferromagnétique: fondements et applications
2014
J.L. Cantin
Jurgen Von Bardeleben
François Gendron
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Etude par RBS-c de la nature de l'interstitiel de Mn dans le composé Ga1-xMnxAs
2012
D Benzeggouta
Khashayar Khazen
Laura Thevenard
Ian Vickridge
Jurgen Von Bardeleben
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A combined photoluminescence and electron paramagnetic resonance study of low energy electron irradiated 4H SiC
2006
Materials Science Forum
W. Sullivan
John W Steeds
Jurgen Von Bardeleben
J.L. Cantin
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Interface Defects in n-Type 3C-SiC/SiO2: An EPR Study of Oxidized Porous Silicon Carbide Single Crystals
2005
Materials Science Forum
Jurgen Von Bardeleben
J.L. Cantin
L. Ke
Y. Shishkin
Rp Devaty
Wj Choyke
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Citations (10)
1