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D. Cantarelli

University of Pavia

Engineering
Electronic engineering
Interconnection
Statistical hypothesis testing
Probability distribution

2

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Novel test strategy for statistical evaluation of defect density and reliability of contacts and vias

2005 IRPS | International Reliability Physics Symposium
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A failure analysis test structure for deep sub-micron CMOS copper interconnect technologies

2005 ICMTS | International Conference on Microelectronic Test Structures
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