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D. Carr
D. Carr
Salisbury University
Ellipsometry
Chemistry
Molecular beam epitaxy
Analytical chemistry
Molecular beam
4
Papers
57
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Phase modulated ellipsometry used for composition control during MBE growth of CdHgTe: an analysis of instrumental factors and an assessment of the material produced
1996
Journal of Electronic Materials
R. H. Hartley
M. A. Folkard
D. Carr
P. J. Orders
G. Shen
V. Kumar
T. A. Steele
I. K. Varga
B. A. Johnson
K. Fueloop
P. Capper
D. Dutton
S Barton
I. G. Gale
F. Grainger
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Citations (1)
In-situ ellipsometric measurements of the MBE growth of CdTe/HgTe and CdTe/ZnTe superlattices
1993
Journal of Electronic Materials
M. A. Folkard
G. Shen
V. Kumar
T. A. Steele
D. Rees
I. K. Varga
D. Carr
K. Fueloep
B. A. Johnson
P. J. Orders
R. H. Hartley
H. Buskes
M. Gal
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Citations (5)
Ellipsometry: a technique for real time monitoring and analysis of MBE-grown CdHgTe and CdTe/HgTe superlattices
1992
Journal of Crystal Growth
R. H. Hartley
M. A. Folkard
D. Carr
P. J. Orders
D. Rees
I. K. Varga
V. Kumar
G. Shen
T. A. Steele
H. Buskes
J.B. Lee
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Citations (24)
Real time control of the molecular‐beam epitaxial growth of CdHgTe and CdTe/HgTe superlattices using ellipsometry
1992
Journal of Vacuum Science & Technology B
R. H. Hartley
M. A. Folkard
D. Carr
P. J. Orders
D. Rees
I. K. Varga
V. Kumar
G. Shen
T. A. Steele
H. Buskes
J.B. Lee
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Citations (27)
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