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Leonid V. Sokolov
Leonid V. Sokolov
Max Planck Society
Molecular beam epitaxy
Materials science
Scanning electron microscope
Atomic physics
Chemistry
8
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174
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Properties of Si Nanowhiskers Coated by TiO x and TiON x Layers
2013
Nanoscience and Nanotechnology
O. V. Naumova
Yu. V. Nastaushev
T. A. Gavrilova
F. N. Dultsev
Leonid V. Sokolov
A. L. Aseev
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Growth of Si whiskers by MBE : Mechanism and peculiarities
2007
Physica E-low-dimensional Systems & Nanostructures
N. D. Zakharov
P. Werner
Leonid V. Sokolov
U. Gösele
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Properties of Silicon Nanowhiskers Grown by Molecular‐Beam Epitaxy
2007
O. V. Naumova
Yuri V. Nastaushev
Svetlana N. Svitasheva
Leonid V. Sokolov
P. Werner
Nikolay Zakharov
Tatyana A. Gavrilova
F. N. Dultsev
A. L. Aseev
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TEM investigation of Si/Ge multilayer structure incorporated into MBE grown Si whiskers
2005
N. D. Zakharov
P. Werner
Gerhard Gerth
Luise Schubert
Leonid V. Sokolov
U. Gösele
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Ordering of nanostructures in a Si/Ge0.3Si0.7/Ge system during molecular beam epitaxy
2002
Semiconductors
G. E. Cirlin
V. A. Egorov
Leonid V. Sokolov
Peter Werner
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Citations (16)
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