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Toshi Nishida
Toshi Nishida
Reliability engineering
Engineering
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A 21st Century Approach to Electronic Device Reliability
2013
Mark E. Law
S. J. Pearton
F. Ren
Toshi Nishida
B. P. Gila
K. S. Jones
Scott E. Thompson
Gijs Bosman
Cammy R. Abernathy
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