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N. Ptak
N. Ptak
University of California, Santa Cruz
Biasing
Electronic engineering
Detector
Beam (structure)
Radiation damage
1
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5
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The Punch-Through Effect in Silicon Strip Detectors
2012
IEEE Transactions on Nuclear Science
C. Betancourt
A. Bielecki
Z. Butko
A. Deran
S. Ely
V. Fadeyev
C. Parker
N. Ptak
H. F-W. Sadrozinski
J. Wright
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Citations (5)
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