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Sagar A. Kekare
Sagar A. Kekare
Synopsys
Engineering
Reliability engineering
Electronic engineering
System on a chip
Chip
5
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11
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デザイナ・インテント・データを使用するウェハとレチクルの検査の方法
2017
marera pooru furanku
Frank Marella Paul
makkourii syaron
Sharon Mccauley
tyan erisu
Ellis Chang
voruku uiriamu
William Volk
uirii zieimuzu
James N. Wiley
watoson sutaaringu
Sterling G. Watson
kekare sagaa ei
Sagar A. Kekare
hesu kaaru
Carl Hess
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SpotMe effective co-optimization of design and defect inspection for fast yield ramp
2013
ASMC | Advanced Semiconductor Manufacturing Conference
Yan Pan
Rao Desineni
Jane Lambert
Edward Teoh
Thomas Berndt
Victor Lim
Goh Szu Huat
John Kim
Sagar A. Kekare
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A memory volume diagnostics methodology to facilitate production yield learning with embedded memories
2012
ASMC | Advanced Semiconductor Manufacturing Conference
Ruth Farrugia
Stephane Lecomte
Tammy Dong Lei Zheng
Christophe Giroud
Florent Garait
Eric Faehn
Christophe Suzor
Sagar A. Kekare
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Rapid root cause analysis and process change validation with design-centric volume diagnostics in production yield enhancement
2010
ASMC | Advanced Semiconductor Manufacturing Conference
Davide Appello
Vincenzo Tancorre
Jacky Gomez
Daniele Li Rosi
Christophe Suzor
Sagar A. Kekare
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Advances on yield learning through concurrent evaluation of design and process data
2009
ASMC | Advanced Semiconductor Manufacturing Conference
Davide Appello
Vincenzo Tancorre
Christophe Suzor
Michael Hall
Salvatore Talluto
Sagar A. Kekare
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Citations (2)
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