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Felice Crupi

Katholieke Universiteit Leuven

6

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60

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Tuning the switching behavior of conductive-bridge memory by the modulation of Cu content in the cation-supplier alloys

2016 Microelectronic Engineering
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Reliability issues in MuGFET nanodevices

2008 IRPS | International Reliability Physics Symposium
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On the defect generation and low voltage extrapolation of Q/sub BD/ in SiO/sub 2//HfO/sub 2/ stacks

2004 VLSIT | Symposium on VLSI Technology
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Location and hardness of the oxide breakdown in short channel n- and p-MOSFETs

2002 IRPS | International Reliability Physics Symposium
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Citations (18)