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Kent Childs

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2013-20635 06:50 Personal Injury Accident: A personal injury

2013
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Coulomb Blockade in Double Top Gated Si MOS Nano-Structures.

2008 Bulletin of the American Physical Society
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Erratum: “Comparison of the submicron particle analysis capabilities of Auger electron spectroscopy, time-of-flight secondary ion mass spectrometry, and scanning electron microscopy with energy dispersive x-ray spectroscopy for particles deposited on silicon wafers with one micron thick oxide layers” [J. Vac. Sci. Technol. A 16, 1825 (1998)]

1998 Journal of Vacuum Science and Technology
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