Old Web
English
Sign In
Acemap
>
authorDetail
>
A.L. Crouch
A.L. Crouch
Computer engineering
Critical path method
Electronic engineering
Debugging
Automatic test pattern generation
1
Papers
23
Citations
0.00
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (1)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
AC scan path selection for physical debugging
2003
IEEE Design & Test of Computers
A.L. Crouch
J. C. Potter
A. Doege
Show All
Source
Cite
Save
Citations (23)
1