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M. Horphatum
M. Horphatum
Ellipsometry
Analytical chemistry
Materials science
Dielectric
Crystallinity
2
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2
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Temperature Dependence of Optical Constants of Silver Film Studied by In Situ Spectroscopic Ellipsometry
2008
Advanced Materials Research
S. Rojebuathong
Pongpan Chindaudom
W. Luangtip
M. Horphatum
P. Eiamchai
V. Patthanasetthakul
Pichet Limsuwan
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Citations (2)
Investigation of Aluminium Diffusion into an Amorphous Silicon Thin Film at High Temperature by In Situ Spectroscopic Ellipsometry
2008
Advanced Materials Research
W. Luangtip
S. Rotbuathong
Pongpan Chindaudom
M. Horphatum
V. Patthanasetthakul
P. Eiamchai
Toemsak Srikirin
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