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Dong-Hyun Go
Dong-Hyun Go
Inha University
Reliability (semiconductor)
specific model
Substrate (electronics)
Materials science
Surface energy
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Effects of Geometric and Crystallographic Factors on the Reliability of Al/Si Vertically Cracked Nanofilm/Substrate Systems.
2021
Materials
Jee Soo Shim
Dong-Hyun Go
Hyeon-Gyu Beom
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