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O. Billoint
O. Billoint
Electronic engineering
Transistor
Voltage
Computer science
Reliability (statistics)
3
Papers
10
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Area and Cost Analysis of the Mixed Signal Circuits in a Novel Monolithic 3D Process
2021
MWSCAS | International Midwest Symposium on Circuits and Systems
Behnam Samadpoor Rikan
Philipp Häfliger
G. Cibrario
O. Billoint
Mehdi Mouhdach
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Optimization of RRAM and OTS selector for advanced low voltage CMOS compatibility
2020
IMW | International Memory Workshop
J. Minguet Lopez
D. Alfaro Robayo
L. Grenouillet
C. Carabasse
G. Navarro
R. Fournel
C. Sabbione
M. Bernard
O. Billoint
C. Cagli
L. Couture
D. Deleruyelle
Marc Bocquet
Jean Michel Portal
E. Nowak
G. Molas
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OxRAM for embedded solutions on advanced node: scaling perspectives considering statistical reliability and design constraints
2019
IEDM | International Electron Devices Meeting
J. Sandrini
Marios Barlas
J. F. Nodin
O. Billoint
G. Molas
R. Fournel
E. Nowak
F. Gaillard
C. Cagli
L. Grenouillet
V. Meli
N. Castellani
I. Hammad
S. Bernasconi
F. Aussenac
S. van Duijn
G. Audoit
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Citations (6)
1