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Alex Cognata

Agilent Technologies

12

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477

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Multi-tone, Multi-port, and Dynamic Memory Enhancements to PHD Nonlinear Behavioral Models from Large-signal Measurements and Simulations

2007 IMS | International Microwave Symposium
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Drain-Source Symmetric Artificial Neural Network-Based FET Model with Robust Extrapolation Beyond Training Data

2007 IMS | International Microwave Symposium
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Measurement-Based Non-Quasi-Static Large-Signal FET Model Using Artificial Neural Networks

2006 IMS | International Microwave Symposium
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Broad-band poly-harmonic distortion (PHD) behavioral models from fast automated simulations and large-signal vectorial network measurements

2005 IMS | International Microwave Symposium
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Enhanced On-Wafer Time-Domain Waveform Measurement Through Removal of Interconnect Dispersion and

2002 IEEE Transactions on Microwave Theory and Techniques
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Removal of cable and connector dispersion in time-domain waveform measurements on 40 Gb integrated circuits

2002 IMS | International Microwave Symposium
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Enhanced on-wafer time-domain waveform measurement through removal of interconnect dispersion and measurement instrument jitter

2002 IEEE Transactions on Microwave Theory and Techniques
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Linearity characteristics of GaAs HBTs and the influence of collector design

2000 IEEE Transactions on Microwave Theory and Techniques
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Influence of collector design on InGaP/GaAs HBT linearity

2000 IMS | International Microwave Symposium
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A 0.5-50 GHz on-wafer, intermodulation, load-pull and power measurement system

1995 IMS | International Microwave Symposium
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