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Tom Bijnagte
Tom Bijnagte
Proof of concept
Cantilever
Atomic force microscopy
Optoelectronics
Semiconductor
6
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4
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0
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3D Advance Metrology by means of 3D Atomic Force Microscopy
2019
Rodolf Herfst
N. Nulkes-de Groot
P. Lucas
Tom Bijnagte
Bert Dekker
J.J.B. Biemond
M.J.C.M. van Riel
B.H.M.F. van Essen
M.E.C.T. van Koppen
J.A.J. Oosterling
Lukas Krämer
E. Nieuwkoop
F. Corbet
L. Visser
Harry de Man
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Design and simulation of atomic force profiling of high aspect ratio samples using 2D subresonant force spectroscopy
2018
AIM | International Conference on Advanced Intelligent Mechatronics
J.J. Benjamin Biemond
Rodolf Herfst
Samaneh Mashaghi
Bert Dekker
Tom Bijnagte
Hamed Sadeghian
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Automated Cantilever Exchange and Optical Alignment for High-Throughput Parallel Atomic Force Microscopy
2017
IEEE-ASME Transactions on Mechatronics
Hamed Sadeghian
Tom Bijnagte
Rodolf Herfst
Geerten Kramer
Lukas Krämer
Bert Dekker
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High-Throughput Atomic Force Microscopes Operating in Parallel
2016
arXiv: Instrumentation and Detectors
Hamed Sadeghian
R.W. Herfst
Bert Dekker
J. Winters
Tom Bijnagte
Ramon Rijnbeek
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High-Throughput Atomic Force Microscopes Operating in Parallel
2016
arXiv: Instrumentation and Detectors
Hamed Sadeghian
Rodolf Herfst
Bert Dekker
Jasper Winters
Tom Bijnagte
Ramon Rijnbeek
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Automated cantilever exchange and optical alignment for High-throughput, parallel atomic force microscopy
2016
arXiv: Instrumentation and Detectors
Tom Bijnagte
Geerten Kramer
Lukas Krämer
Bert Dekker
Rodolf Herfst
Hamed Sadeghian
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