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H. Viturro

National Scientific and Technical Research Council

5

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47

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Measuring system for obtaining concentration profiles in supported catalysts using electron-probe microanalysis. Influence of standards

1995 X-Ray Spectrometry
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A simple backscattered electrons and specimen current detection device for the scanning electron microscope

1993 Scanning
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Statistical inference, state distribution, and noisy data

1993 Physica A-statistical Mechanics and Its Applications
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Structural changes on deactivation of ZSM-5. A study by X-ray powder diffraction

1992 Materials Chemistry and Physics
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XTL‐SIZE: a computer program for crystal‐size‐distribution calculation from X‐ray diffraction line broadening

1990 Journal of Applied Crystallography
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