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Maxime Thammasack

École Polytechnique Fédérale de Lausanne

8

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34

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An FPGA-Based Test System for RRAM Technology Characterization

2018 IEEE Transactions on Nanotechnology
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Effect of O2- migration in Pt/HfO2/Ti/Pt structure

2017 Journal of Electroceramics
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Low Temperature Wet Conformal Nickel Silicide Deposition for Transistor Technology through an Organometallic Approach

2017 ACS Applied Materials & Interfaces
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Low-voltage read/write circuit design for transistorless ReRAM crossbar arrays in 180nm CMOS technology

2015 ISCAS | International Symposium on Circuits and Systems
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A ultra-low-power FPGA based on monolithically integrated RRAMs

2015 DATE | Design, Automation, and Test in Europe
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