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Jörg Schneider
Jörg Schneider
Paul Scherrer Institute
Crystallography
Beamline
Swiss Light Source
Analytical chemistry
Diffraction
4
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104
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A compact and versatile tender X-ray single-shot spectrometer for online XFEL diagnostics
2018
Journal of Synchrotron Radiation
Jens Rehanek
Christopher J. Milne
Jakub Szlachetko
Joanna Czapla-Masztafiak
Jörg Schneider
Thomas Huthwelker
Camelia N. Borca
Reto Wetter
L. Patthey
Pavle Juranić
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Citations (3)
D3, the new diffractometer for the macromolecular crystallography beamlines of the Swiss Light Source
2014
Journal of Synchrotron Radiation
Martin R. Fuchs
Claude Pradervand
Vincent Thominet
Roman Schneider
Ezequiel Panepucci
Marcel Grunder
Jose Gabadinho
Florian S. N. Dworkowski
T. Tomizaki
Jörg Schneider
Aline Mayer
Adrian Curtin
Vincent Olieric
Uli Frommherz
Goran Kotrle
Jörg Welte
Xinyu Wang
Stephan Maag
Clemens Schulze-Briese
Meitian Wang
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Citations (21)
SLS Crystallization Platform at Beamline X06DA—A Fully Automated Pipeline Enabling in Situ X-ray Diffraction Screening
2011
Crystal Growth & Design
Rouven Bingel-Erlenmeyer
Vincent Olieric
J. P. A. Grimshaw
Jose Gabadinho
X. Wang
Simon Ebner
A. Isenegger
Roman Schneider
Jörg Schneider
W. Glettig
Claude Pradervand
Ezequiel Panepucci
T. Tomizaki
Meitian Wang
Clemens Schulze-Briese
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Citations (80)
Automated in situ diffraction screening at beamline X06DA at the Swiss Light Source
2011
Acta Crystallographica Section A
Meitian Wang
Vincent Olieric
C. Stirnimann
Rouven Bingel-Erlenmeyer
Jörg Schneider
Jose Gabadinho
Ezequiel Panepucci
T. Tomizaki
X. Wang
Roman Schneider
Claude Pradervand
W. Glettig
A. Isenegger
Clemens Schulze-Briese
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