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Damien Heimes
Damien Heimes
Materials science
Multislice
Molecular physics
Pattern recognition
Artificial intelligence
4
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14
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Characterization of III/V Semiconductors on Silicon by Analyzing 4D-STEM Data with Convolutional Neural Networks
2021
Microscopy and Microanalysis
Damien Heimes
Jonas Scheunert
Andreas Beyer
Jürgen Belz
Saleh Firoozabadi
Kerstin Volz
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