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Yukiko Manabe

Hitachi

6

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98

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A new data retention mechanism after endurance stress on flash memory

2000 IRPS | International Reliability Physics Symposium
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Anomalous Leakage Current Model for Retention Failure in Flash Memories

1999 The Japan Society of Applied Physics
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Detailed observation of small leak current in flash memories with thin tunnel oxides

1998 ICMTS | International Conference on Microelectronic Test Structures
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Monte Carlo simulation of stress-induced leakage current by hopping conduction via multi-traps in oxide

1998 IEDM | International Electron Devices Meeting
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