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G. Pananakakis

École nationale supérieure d'électronique et de radioélectricité de Grenoble
Los Angeles Harbor College
Centre national de la recherche scientifique

171

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1946

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On the cumulative distribution function of the defect centric model for BTI reliability

2019 Microelectronics Reliability
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Analytical expressions for subthreshold swing in FDSOI MOS structures

2018 Solid-state Electronics
- G. Ghibaudo
- G. Pananakakis
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Impact of Blend Morphology on Interface State Recombination in Bulk Heterojunction Organic Solar Cells

2015 Advanced Functional Materials
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Physics of the frequency response of rectifying organic Schottky diodes

2014 Journal of Applied Physics
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Modeling of the impact of source/drain regions on short channel effects in MOSFETs

2013 ULIS | International Conference on Ultimate Integration on Silicon
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A New Insight on I RESET Reduction of Carbon-doped GST based PCM

2013 The Japan Society of Applied Physics
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Impact of quantum effects on the short channel effects of III–V nMOSFETs in weak and strong inversion regimes

2013 Solid-state Electronics
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Origins of the short channel effects increase in III-V nMOSFET technologies

2012 ULIS | International Conference on Ultimate Integration on Silicon
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Lowering the Reset Current and Power Consumption of Phase-Change Memories with Carbon-Doped Ge2Sb2Te5

2012 IMW | International Memory Workshop
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An Efficient Nonlocal Hot Electron Model Accounting for Electron–Electron Scattering

2012 IEEE Transactions on Electron Devices
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Citations (6)