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Susan K. Lichtensteiger
Susan K. Lichtensteiger
IBM
Electronic engineering
Leakage (electronics)
Gate oxide
Voltage
Engineering
4
Papers
15
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Using Selective Voltage Binning to Maximize Yield
2013
IEEE Transactions on Semiconductor Manufacturing
Susan K. Lichtensteiger
Jeanne P. Bickford
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Citations (4)
Accurate chip leakage prediction: Challenges and solutions
2012
VLSIT | Symposium on VLSI Technology
Xiaojun Yu
Jie Deng
Sim Y. Loo
Kevin K. Dezfulian
Susan K. Lichtensteiger
Jeanne P. Bickford
Nazmul Habib
Paul Chang
Anda C. Mocuta
Ken Rim
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Using selective voltage binning to maximize yield
2012
ASMC | Advanced Semiconductor Manufacturing Conference
Susan K. Lichtensteiger
Jeanne P. Bickford
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Citations (6)
Modeling leakage in ASIC libraries
2005
CICC | Custom Integrated Circuits Conference
Susan K. Lichtensteiger
Larry Wissel
Jim Engel
Paul Sulva
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Citations (3)
1