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M. Heima
M. Heima
Chalmers University of Technology
Scanning electron microscope
Cubic zirconia
Microstructure
Oxide
Ellipsometry
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Determination of oxide thickness on an Si2N2OZrO2 composite by spectroscopic ellipsometry
1995
Journal of The European Ceramic Society
M. Heima
H. Arwin
Jiaxin Chen
R. Pompe
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Citations (6)
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