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A. Al-Khalidi
A. Al-Khalidi
University of Glasgow
Transistor
Breakdown voltage
Passivation
gate length
Voltage
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The role of SiN/GaN cap interface charge and GaN cap layer to achieve enhancement mode GaN MIS-HEMT operation
2020
Microelectronics Reliability
K. Ahmeda
B. Ubochi
M.H. Alqaysi
A. Al-Khalidi
Edward Wasige
Karol Kalna
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