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J. R. Verkouteren
J. R. Verkouteren
Thin film
Nanocrystalline material
X-ray
Crystallite
Lattice constant
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COMPARISON OF LABORATORY-BASED X-RAY MICRODIFFRACTION AND ELECTRON BACKSCATTER DIFFRACTION FOR PHASE IDENTIFICATION
2001
J. R. Verkouteren
John A. Small
J.R. Michael
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