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Isabel Menendez-Moran
Isabel Menendez-Moran
Agere Systems
Wafer
Burn-in
Engineering
Reliability engineering
Electronic engineering
3
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Wafer Level Stress data succesfully used as early butn-in predictor
2014
Ana Sacedon
Miguel Angel Merino
Vidal Martín
Jesús Iñarrea
Francisco J. Sanchez Vicente
Jesus de la Hoz
Jose Angel Ayucar
Isabel Menendez-Moran
A. Riloba
C. Mata
Miguel Recio
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Wafer level stress data successfully used as early burn-in predictor
2001
ASMC | Advanced Semiconductor Manufacturing Conference
Ana Sacedon
Miguel Alonso Merino
Vidal Martín
Jesús Iñarrea
F.J. Sanchez-Vicente
J. M. de la Hoz
Jose Angel Ayucar
Isabel Menendez-Moran
A. Riloba
C. Mata
Miguel Recio
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Wafer-level stress data successfully used as early burn-in predictor
2001
Advanced Semiconductor Manufacturing Conference
Ana Sacedon
Miguel Alonso Merino
Victorino Martin Santamaria
Jesús Iñarrea
Francisco J. Sanchez-Vicente
Jesus de la Hoz
Jose Angel Ayucar
Isabel Menendez-Moran
A. Riloba
C. Mata
Miguel Recio
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